Silicon Preparation
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Other Wafer Manufacturing Metrology Equipment
AFM-2 (METV44-1)
Atomic Force Microscope (AFM) An Atomic Force Microscope (AFM) measures topography, feature size, defects, and properties of solid surfaces. The Dimension X AFM provides depth metrology solutions.
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Ramgraber SST
Used Configuration:
Tank 1: EKC
Tank 2: P1331
Tank 3 and 4: DMF
Tank 5: IPA
Known errors:
Filter from tank 4 is leaking
Heater 1 from tank 4 is broken
Heater 3 from tank 4 is broken
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Closing Date: Dec 30, 2030
Other Wafer Production Equipment
EPITAXY EQUIPMENT
Equipment is under good condition (w/ 3 chambers)
Currently inside the cleanroom environment; under idle/warm down condition
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Other Wafer Production Equipment
PIXDRO4
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