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	View All Offers Under Automatic Test Equipment » Switch Major Category		Click an item's ID# below for its full specifications , or: Group Offers into sub-categories under Automatic Test Equipment List all 16 product types under Automatic Test Equipment

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Item ID  Short Description Product Type / Details # Price Notes Make Model     253002 Delta Design   MATRIX DM8880  SMD Handlers in Device Handlers 1   252923 Multitest   MT8589  DIP Handlers in Device Handlers 1   252922 Multitest   MT8589  DIP Handlers in Device Handlers 1   252926 Rasco   SO1000T  DIP Handlers in Device Handlers 1   252925 Rasco   SO1800T  DIP Handlers in Device Handlers 1   252924 Rasco   SO1800T  DIP Handlers in Device Handlers 1   256501 Advantest   T5376 Memory Tester  Memory Test Systems in Device Testers Penang Advantest T5376 Memory Tester (Wafer Level Sorting): Advantest T5376 Memory Tester (Use for Wafer level Sorting) CPU Type : SPARC Model: T5376 MC ID :SPN109 MF Date: APR, 2004 Location: KGD Penang Asset Number : ZNPG-103864-0 1   256546 Advantest   T5376 Memory Tester  Memory Test Systems in Device Testers Penang Advantest T5376 Memory Tester (Wafer Level Sorting): Advantest T5376 Memory Tester (Use for Wafer level Sorting) CPU Type : SPARC Model: T5376 MC ID :SPN129 MF Date: Aug, 2004 Location: KGD Penang Asset Number : ZNPG-101412-0 1   256548 Advantest   T5376 Memory Tester  Memory Test Systems in Device Testers Penang Advantest T5376 Memory Tester (Wafer Level Sorting): Advantest T5376 Memory Tester (Use for Wafer level Sorting) CPU Type : SPARC Model: T5376 MC ID :SPN130 MF Date: Aug, 2004 Location: KGD Penang Asset Number : ZNPG-101413-0 1   236302 Teradyne   Catalyst Mixed Signal  Mixed Signal Test Systems in Device Testers Teradyne Catalyst: TESTER ID           : CAT-004 Model  : CATALYST MIXED SIGNAL Manufacturer   : Teradyne Serial No.  : 0027H256  Date Released  : 15/09/00 COMPUTER HW/SW: Tester Computer  : Suns ULTRA60 / 256 MB RAM User Computer  : Suns ULTRA5 / 256 MB RAM HD  : 8.5 GB Software  : Solaris –OS rev. 5.5.1 IMAGE Rev.  : 7.0 D8 Tester DIG: Data rate  : 200 MHZ DP CH  : 256 CH Tester DC: DC SRC Matrix  : 4 CH DC DUT SRC  : 8 CH AAPU PIN  : 48 CH STORED DATA BITS  : 48 CH System PPMU  : 1 CH TESTER AC: PLFS/PLFD  : 4CH VHF AWG400  : 1CH VHF DIG  : 2CH PAC Card Cage  : 3 VREG  : 2 CH DOCKING/MANIPULATOR: Docking  : SNR DOCKING Manipulator  : UNIVERSAL Manipulator Input Power: Power Supply  : 380 VAC, / 48 Amp        50/60Hz, 3 phase Power Consumption Rate   : 31.6 KVA (Max) 1   249730 Teradyne   J750  Digital Test Systems in Device Testers Teradyne J750: Teradyne J750 Testequipment 1   254116 FET/TEST,INC MADE IN   FET 3602E  Digital Test Systems in Device Testers 1   257485 Tokyo Seimitsu Co.,   UF200  Probe Equipment - Other in Wafer Probers TSK UF200F Inker: TSK  UF200F  inker  Machine (support  8 inch wafer inking process) Equipment  ID : TSK11  S/N: F02099BV Location : Penang, Malaysia Asset Number : ZNPG-100838-0 Note: Equipment  still support Penang production until end of Sep 2025. Only allow sell out  after end of  Sep 2025.   1   N* 257487 Tokyo Seimitsu Co.,   UF200  Probe Equipment - Other in Wafer Probers TSK UF200F Inker: TSK  UF200F  inker  Machine (support  8 inch wafer inking process) Equipment  ID : TSK12 S/N: F02097BV Location : Penang, Malaysia Asset Number : ZNPG-100910-0 Note: Equipment  still support Penang production until end of Sep 2025. Only allow sell out  after end of  Sep 2025.   1   N*

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.