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Automatic Test Equipment


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List all 16 product types under Automatic Test EquipmentList all 16 product types under Automatic Test Equipment

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 Offered (box) or Wanted (coins)  Item ID  Short Description Product Type / Details # Price Notes
Make Model
   
203088
2 set of inline tester 

List all items of this typeRetho Test Equipment

in Automatic Test Equipment

2 set of inline tester:

2 set of inline tester

asset no:10005027 & 10005029


LOCATION: Wuxi
2 ¥ 5,787,004.00
207727

ECA Advance Automati  

EC328FP 

List all items of this typeSMD Handlers

in Device Handlers

1  
212377
INLINER MACHINE,Trim & Form Machine 

List all items of this typeRetho Test Equipment

in Automatic Test Equipment

INLINER MACHINE,Trim & Form Machine:
100070530INLINER MACHINE8500035930;transfer asset from IFMY; 6JM/00922
100070531freight: INLINER MACHINE8500035930;transfer asset from IFMY; 04011117
100070532CIQ fee and freight: INLINER MACHINE8500035930;transfer asset from IFMY; 6JM/00922
100047060Trim & Form MachineTransfer MY
100047061Trim & Form Machine0
100047062Cut & Bending ToolTransfer MY
100066520TRIM&FORM MACHINE8500029675;transfer from IFMY;INV# 6JM/00192
100066521customs duty: TRIM&FORM MACHINE8500029675;transfer from IFMY;INV# 6JM/00192
100066522hookup: TRIM&FORM MACHINE8500029675;transfer from IFMY;INV# 6JM/00192

 

3  
209427

Multitest  

MT8589 

List all items of this typeSMD Handlers

in Device Handlers

1   F*
209428

Multitest  

MT8589 

List all items of this typeSMD Handlers

in Device Handlers

1   F*
147228

Multitest  

MT8502 

List all items of this typeDIP Handlers

in Device Handlers

Multitest MT8502 TriTemp gravity Handler:
Multitest MT8502 TriTemp gravity Handler

Multitest MT8502 TriTemp gravity Handler
LOCATION: MchC
SERIAL NUMBER(S): na
1   F*
203189

NexGen Technologies  

Nexgen Prober 2013 Model 

List all items of this typeProbe Equipment - Other

in Wafer Probers

NEXGEN SEMI AUTOMATIC PROBER:

NexGen semi-automatic prober

for 3,4,5,6 & 8 inches wafer with hot chuck PCB to 130°.

More information available below and on the enclosed flyer :

Accuracy within 6 Microns and Maximum X/Y Speed 250 mm (10") sec

ZStage/Chuck 

- Range : 0.200" (other configurations available)

- Speed : 11 ms

Loader (Wafer Handler)

- Cassette capacity : 2 Standard; 1 sender, 1 receiver

- Wafer handling : Belt and vacuum arm

- Fine alignment : CCD Image Processing

- Hard Disk Drive : 60 -250 gig

- Disk Drives : USB, CD/RW, DVD Writer

- Display : 22" Color Screen Monitor

- Power consumption (included) : 1.5 KVA

Facilities Required

- Air : 75 PSI @ 3 CFM

- Vacuum : 25in/hg

- Dimensions 

InchesCm
48"w x 32"d x  60"h115 (L) x 80 (l) x 140 (h)

 - Weight 

LbKg
700317
1  
209409

Rucker & Kolls  

680A 

List all items of this typeProbe Equipment - Other

in Wafer Probers

SEMI AUTOMATIC PROBE STATION 6" RUCKER&KOLLS:
 

Wafer Size:

6"
Probe station, 6"
Ni-plated vacuum chuck
Automatic stepping
Motorized X-Y stage
stereo zoom microscope
1  
202601

Teradyne  

J971-61 SML 256CH1TH 

List all items of this typeDigital Test Systems

in Device Testers

Teradyne J971:

Tool in good condition. Stored in Warehouse. Tool will be released from Infineon for sale by end of 2020.

 

 

1  


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.