Item ID: 210272 1 Offered at Best Price Bruker Fabline D8 Röntgendiffraktometer zur Messung hochauflösender Röntgenbeugung und Röntgenreflektion mit CU-KA Anode für 6" und 8" Wafer X-Ray Diffractometer for measuring high resolution X-ray Diffraction and Reflection applications with a Cu-kA Anode for 6 and 8 inch wafersStill in production. Ready for inspection. ... other images Unit Price Unstated Number of Units 1 Manufacturer Bruker Model Fabline D8 Wafer Size Range Minimum 150 mm Maximum 200 mm Set Size 200 mm Wafer Mapping YES Condition Very Good Year of Manufacture 2011 CE Marked YES RELATED DOCUMENTS: click links to view 5 Serial Number(s)205758 Shipping & Handling:All items are sold on condition `as is and where is`. Ex work from current location excluding de-installation, de-hook up, discharge, packaging, crating and delivery. We are not responsible for any damage incurred during shipment. Payment:100% downpayment Make OFFERSend QUESTIONS
Röntgendiffraktometer zur Messung hochauflösender Röntgenbeugung und Röntgenreflektion mit CU-KA Anode für 6" und 8" Wafer
X-Ray Diffractometer for measuring high resolution X-ray Diffraction and Reflection applications with a Cu-kA Anode for 6 and 8 inch wafers
Still in production. Ready for inspection.
205758
All items are sold on condition `as is and where is`. Ex work from current location excluding de-installation, de-hook up, discharge, packaging, crating and delivery. We are not responsible for any damage incurred during shipment.
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