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FULL DESCRIPTION of Item 210272

in Xray Fluorescence Spectrometers
Item ID: 210272

Offered 1 Offered at Best Price


Bruker Fabline D8

Röntgendiffraktometer zur Messung hochauflösender Röntgenbeugung und Röntgenreflektion mit CU-KA Anode für 6" und 8" Wafer

 

X-Ray Diffractometer for measuring high resolution X-ray Diffraction and Reflection applications with a Cu-kA Anode for 6 and 8 inch wafers

Still in production. Ready for inspection.

 Bruker Fabline D8
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Unit Price Unstated
Number of Units 1
Manufacturer Bruker
Model Fabline D8
Wafer Size Range 
  Minimum 150 mm
  Maximum 200 mm
  Set Size 200 mm
Wafer Mapping YES
Condition Very Good
Year of Manufacture 2011
CE Marked YES
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Serial Number(s)

205758


Shipping & Handling:

All Items are sold FCA Infineon location excluding packaging and delivery. We are not responsible for any damage incurred during shipment.
 
Payment:

100% downpayment