 |
Item ID |
Short Description |
Product Type / Details |
#
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Price |
Notes |
Make |
Model |
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257112
|
Tesec |
4330IH |
in Wafer Testers
4330IH TESEC HOT & COLD TEST:4330IH TESEC HOT & COLD TEST
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1
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257113
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Tesec |
4330IH |
in Wafer Testers
4330IH TESEC HOT & COLD TEST:4330IH TESEC HOT & COLD TEST
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1
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254741
|
Veeco |
AFM-2 (METV44-1) |
in Wafer Manufacturing Metrology Equipment
AFM-2 (METV44-1) :Atomic Force Microscope (AFM) An Atomic Force Microscope (AFM) measures topography, feature size, defects, and properties of solid surfaces. The Dimension X AFM provides depth metrology solutions.
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1
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255422
|
Hewlett Packard |
AOT |
in Wafer Testers
AOT3 Bundle :-Tester AOT, Bundle sale preferred AOT3-06 | AOT3-07 | AOT3-08 | AOT3-20 | 3444A40234 | 3607A40332 | 3527A40287 | 30451 |
AOT3-29 | AOT3-33 | AOT3-36 | AOT3-38 | 30705 | 37978 | 40117 | 40128 |
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8
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lot
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255044
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Canon |
CAI518 |
in Production Equipment
CAI518 Canon FPA 3000 i5+:CAI Canon FPA 3000 i5+
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1
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259153
|
Canon |
CAI519 |
in Production Equipment
CAI519 Canon FPA 3000 i5+:Canon FPA 3000 i5+ General Configuration: - FPA 3000 - i5(+)
- Manufactured in June / 1997
- 8“ Wafer Chuck, Notch PA unit
- 6“ Nikon-type Reticle Changer
- Reticle Barcode-Reader = yes
- Cassette Barcode Reader = yes
- Pellicle Particle Checker = yes
- Online - ESPA = yes
- Interface type: right
- Standard flys eye lens
- Chamber type: CD80
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1
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255826
|
CDE |
CDE80/2 Plasma Etch |
in Production Equipment
CDE80/2 Plasma Etch:The system was in production until February 2025.
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1
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255825
|
CDE |
CDE80/3 Plasma Etch |
in Production Equipment
CDE80/3 Plasma Etch:The system was in production until February 2025.
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1
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257675
|
Canon |
LITVC1-02 |
in Production Equipment
Cluster Tool: TEL ACT12 + Canon FPA- 5500iZ:TEL ACT12 - Double Block - 300mm + LITVC1-02
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1
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254729
|
Yushin |
Demount - 7 |
in Production Equipment
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1
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255039
|
Yushin |
Demount-2 |
in Production Equipment
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1
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254524
|
Disco |
Disco 12 DFG850 |
in Grinders
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1
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252846
|
Microcontrol |
Microcontrol 408 II |
in Production Equipment
Foil Peeling Tools / Detaper:Tools are under good condition. Tools are currently productive in Infineon Kulim. Bundle sale in 2 tools together = Euro 60k
|
1
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€ 30,000.00 |
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255151
|
Fusion Systems Inc. |
200 PCU |
in Production Equipment
FUSION 150/3D:Fusion Semiconductor- die Anlage war bis zur Deinstallation Jänner 25 in Produktion.
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1
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255180
|
Fusion Systems Inc. |
200 PCU |
in Production Equipment
FUSION 150/7D:Die Anlage war bis zur Deinstallation in Jänner 2024 in Produktion.
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1
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250342
|
Disco |
Disco 25 DFG8560 |
in Grinders
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1
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250829
|
Heina TT2-1000/1000 |
in Production Equipment
Heina TT2-1000/1000:Two 100cm drums installed Last time in operation in 07/2024 No damages
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1
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254733
|
IVS |
IVS120 |
in Production Equipment
IVS-1:The IVS120 is an automatic metrology system designed for measuring critical dimensions (CD´s).
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1
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255052
|
Ismeca |
KGD01 |
in Production Equipment
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1
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255056
|
Ismeca |
KGD02 |
in Production Equipment
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1
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256618
|
Longhill Industries |
LH-860 |
in Production Equipment
LH-860 LONGHILL MOUNTER :
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1
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254657
|
Nikon |
Nikon 23 Optiphot 200 |
in Wafer Manufacturing Metrology Equipment
Nikon 23 Optiphot 200:Microscope with Handler for 5" or 6" Wafer.
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1
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254656
|
Nikon |
Nikon 7 Optiphot 200 |
in Wafer Manufacturing Metrology Equipment
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1
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255055
|
BTI |
BTI BDF-41 Oxide |
in Production Equipment
OFEN22B BTI BDF- 41 Oxide:BTI BDF- 41 Oxide
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1
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255057
|
BTI |
BTI BDF-41 Oxide |
in Production Equipment
OFEN23B BTI BDF-41 Oxide:BTI BDF-41 Oxide
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1
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255047
|
Applied Materials |
P5000 17 |
in Production Equipment
P5000 17:Area | CVD | Equ. Grp Code | 83404 | Workcenter (Equ. Grp. Name) | A_CV_SNIT_P5000_RS_8 | Completeness fully/some parts missing/ many parts missing | Yes, fully complete | Vendor | AMAT | Tooltype | P5000 | Qty. of Chambers | 4 | Spares to sell | No | Wafer Diameter | 8 | Date of availability | available immdiately | Status | De-installed |
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1
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255048
|
Applied Materials |
P5000 20 |
in Production Equipment
P5000 20:Area | DEP | Equ. Grp Code | 73401 | Workcenter (Equ. Grp. Name) | A_CV_SNIT_P5000_K_6 | Completeness fully/some parts missing/ many parts missing | Yes, fully complete | Vendor | AMAT | Tooltype | P5000 | Qty. of Chambers | 4 | Spares to sell | No | Wafer Diameter | 6 | Date of availability | available immdiately | Status | De-installed | Storage location | Warehose |
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1
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255049
|
Applied Materials |
P5000 21 |
in Production Equipment
P5000 21:Area | DEP | Equ. Grp Code | 79402 | Workcenter (Equ. Grp. Name) | A_CV_SNIT_P5000_K_RS_6 | Completeness fully/some parts missing/ many parts missing | Yes, fully complete | Vendor | AMAT | Tooltype | P5000 | Qty. of Chambers | 4 | Spares to sell | No | Wafer Diameter | 6 | Date of availability | available immdiately | Status | De-installed |
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1
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255050
|
Applied Materials |
P5000 34 |
in Production Equipment
P5000 34:Toolcode sending site | P500034 | IFX ET ID: | 255050 | Area | PET | EqToolcode sending site | P500034 | IFX ET ID: | 255050 | Area | PET | Equ. Grp Code | 78222 | Workcenter (Equ. Grp. Name) | P_AN_POL_P5000_K_6 | Completeness fully/some parts missing/ many parts missing | Yes, fully complete | Vendor | AMAT | Tooltype | P5000-MXP | u. Grp Code | 78222 | Workcenter (Equ. Grp. Name) | P_AN_POL_P5000_K_6 | Completeness fully/some parts missing/ many parts missing | Yes, fully complete | Vendor | AMAT | Tooltype | P5000-MXP |
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1
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255046
|
Applied Materials |
P5000 9 |
in Production Equipment
P5000 9:Area | CVD | Equ. Grp Code | 79404 | Workcenter (Equ. Grp. Name) | A_CV_SNIT_P5000_K_RS_GAN_6 | Completeness fully/some parts missing/ many parts missing | Yes, fully complete | Vendor | AMAT | Tooltype | P5000 | Qty. of Chambers | 2 + 2 | Spares to sell | No | Comments | Gora 2 | Surplus Nr | 255046 | Wafer Diameter | 8 | Date of availability | available immdiately | Status | De-installed |
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1
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255042
|
Nitto |
PFM2 |
in Production Equipment
|
1
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254560
|
Heller Industries |
PFP-HOT |
in Production Equipment
|
1
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260355
|
PVA SPA Waferscale WS200 (MET902-01) |
in Wafer Manufacturing Metrology Equipment
PVA SPA Waferscale WS200 (MET902-01):Waferscale for 8" Wafer STD + Taiko
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1
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N* |
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260356
|
PVA SPA Waferscale WS200 (MET902-02) |
in Wafer Manufacturing Metrology Equipment
PVA SPA Waferscale WS200 (MET902-02):Waferscale for 8" Wafer STD
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1
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N* |
|
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260357
|
PVA SPA Waferscale WS300 (MET902-03) |
in Wafer Manufacturing Metrology Equipment
PVA SPA Waferscale WS300 (MET902-03):Waferscale for 8" STD / 8" Taiko / 12" STD/ 12" Taiko
|
1
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N* |
|
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239644
|
Ramgraber |
SST |
in Wafer Cleaners
Ramgraber SST:Used Configuration: Tank 1: EKC Tank 2: P1331 Tank 3 and 4: DMF Tank 5: IPA Known errors: Filter from tank 4 is leaking Heater 1 from tank 4 is broken Heater 3 from tank 4 is broken
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1
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F* |
|
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256749
|
Semitool |
Cintillio SAT |
in Wafer Cleaners
Semitool Cintillio SAT (WET998-03):Toolcontroller with Windows XP Remote controller Ready for endpointdetection system Process: Copper / Titan-Wolfram / dHF (dilluted HF) div. spareparts possible (negotiable)
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1
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248147
|
Semi-Tool |
|
in Production Equipment
Semitool Raider:- Tool is not fully functional and not in the original condition - Tool can be used as donor tool only - No pictures available but tool inspection is possible
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1
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256349
|
Disco |
DFS8960 Surface Planer |
in Grinders
Surface Planer DPLAN1:The "DPLAN1" (DFS8960 Surface Planer from Disco) is a high-precision tool used in the manufacturing industry for surface finishing. The system is currently fully functional and was used regularly in production until February 2025.In addition to the mainframe itself, the equipment includes a sedimentation tank (collection container), a DTU1531 (chiller unit), and two duct units for exhausting the process chambers! The tool has been operated in both 8" and 12" configurations and is in perfect condition.
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1
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257111
|
SRM |
TD16 |
in Wafer Testers
TD16 SRM Electrical Test:TD16 SRM Electrical Test
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1
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256864
|
SRM |
TD16 |
in Wafer Testers
TD16 SRM Electrical Test:TD16 SRM Electrical Test
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1
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256867
|
SRM |
SRM |
in Wafer Testers
TD20 SRM Electrical Test:TD20 SRM Electrical Test
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1
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256871
|
SRM |
TD20 |
in Wafer Testers
TD20 SRM Electrical Test:TD20 SRM Electrical Test
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1
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257581
|
Tesec |
TESEC_TURRET |
in Wafer Testers
TESEC Tester TESEC_TURRET:TESEC Tester TESEC_TURRET
|
1
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257582
|
Tesec |
TESEC_TURRET |
in Wafer Testers
TESEC Tester TESEC_TURRET:TESEC Tester TESEC_TURRET
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1
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257583
|
Tesec |
TESEC_TURRET |
in Wafer Testers
TESEC Tester TESEC_TURRET:TESEC Tester TESEC_TURRET
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1
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257584
|
Tesec |
TESEC_TURRET |
in Wafer Testers
TESEC Tester TESEC_TURRET:TESEC Tester TESEC_TURRET
|
1
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257585
|
Tesec |
TESEC_TURRET |
in Wafer Testers
TESEC Tester TESEC_TURRET:TESEC Tester TESEC_TURRET
|
1
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254561
|
Mechatronics Inc |
TWH 001 06 11 |
in Production Equipment
|
1
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|
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260582
|
Trikon Tech Ltd. |
Sigma FxP200 RevA |
in Production Equipment
Trikon Sigma FxP200 RevA mit MX800 Platform:It´s a Trikon Sigma FxP200 with 4 Std RevA DEP Chambers, 1 RevA HSE (not complete), 1 MKII Heat Chamber. Brooks MX800 Platform with 2 Swing Out VCE6 Loadlocks. The Platform is upgradet from T5 Controller (MX800) to GTM with PC104 Controller. All DEP Chambers HSE and Transport has CTI Onboard 8F Cryos and 2 9600 Cryo Compressor. No Forline Pumps
|
1
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N* |
|
 |
249014
|
Accretech |
TSK |
in Wafer Manufacturing Metrology Equipment
TSK Prober UF200/UF200A Bundle :Several TSK Probers for sale. Preferred as package sale.
TSK-136 | TSK-050 | TSK-089 | TSK-123 | TSK-117 | TSK Prober + Hinge | TSK-Prober | TSK-Prober | TSK-Prober+Hinge | TSK Prober | UF200 | UF200 | UF200A Cool | UF200A | UF200A |
TSK-094 | TSK-061 | TSK-120 | TSK-119 | TSK-113 | TSK Prober | TSK Prober + Hinge | TSK-Prober | TSK-Prober | TSK-Prober | UF200 | UF200A | UF200A | UF200A | UF200A |
TSK-008 | TSK-044 | TSK-073 | TSK-106 | TSK-145 | TSK-Prober | TSK-Prober | TSK-Prober | TSK-Prober+Hinge | TSK-Prober+Hinge | UF200 | UF200 | UF200A | UF200A | UF200A |
|
15
|
|
|
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|
 |
261083
|
Accretech |
TSK |
in Wafer Manufacturing Metrology Equipment
TSK Prober UF200A Bundle:Several TSK Probers for sale. Preferred as package sale.
| TSK-114 | TSK-075 | TSK-125 | TSK-134 | TSK-088 | TSK-072 | Probertyp | UF200A | UF200A | UF200A | UF200A | UF200A | UF200A | Inventar Nr. | IFAT 230409 | IFAT 229610 | IFAT 230644 | IFAT 230849 | IFAT 230161 | IFAT 229803 | Serial Nr. | F12041CA | F120134GY | F12012EA | F12028GA | F12008GZ | F12047EY | Hinge Manipulator | Yes | Yes | No | No | No | No | Type of tester head plate | Agilent | Agilent | Microflex | MMCi Standard | MMCi Standard | MMCi Standard | Prober power supply rate | 230V | 230V | 230V | 230V | 230V | 230V | Chuck Type (Nickel, Gold, etc.) | Gold, Ring Pattern, Stagepin Bernoulli, Low Noise | Gold, Ring Pattern, Stagepin Bernoulli, Low Noise | Gold, Ring Pattern, Stagepin Bernoulli | Gold, Ring Pattern, Stagepin Bernoulli | Gold, Ring Pattern, Stagepin Bernoulli | Gold, Ring Pattern, Stagepin Bernoulli |
|
6
|
|
|
N* |
|
 |
254558
|
Applied Materials |
MS9 E500 EHPI |
in Production Equipment
|
1
|
|
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|
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254562
|
LAM Research Corp. |
SEZ 323 |
in Wafer Cleaners
|
1
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|
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256348
|
LAM Research Corp. |
WETV18-04 |
in Wafer Cleaners
WETV18-04 SP304 :consisting of the main unit, 3 chemical cabinets and sub-equipment
|
1
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254742
|
Ramgraber |
SST RamOS 300-1-5 |
in Wafer Cleaners
WETV76-01 (SST4D):Ehemalige Chemie-Tankbelegung: Tank 1: EKC Tank 2: P1331 Tank 3 und Tank 4: DMF Tank 5: IPA Datenblätter siehe Anhang. Anlagenfehler: Die Filterkerze vom Tank 4 ist undicht. Die Tankheizung 1 vom Tank 4 ist defekt und abgeklemmt. Die Tankheizung 3 vom Tank 4 ist defekt und abgeklemmt.
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1
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