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Item ID |
Short Description |
Product Type / Details |
#
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Price |
Notes |
| Make |
Model |
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247975
|
Nova |
SCAN-2040 |
in Metrology Equipment
4 x NOVA SCAN-2040 Measurement System:| NOVASCAN | SCAN-2040 | FILMTHICKNES | INSPECTION |
4 x Integriertes Ebara Measurement Systems and spare parts listed in file below
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1
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 |
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204578
|
Orbotech |
Ultra Discovery VM |
in Metrology Equipment
AOI Orbotech Ultra Discovery VM:Simple, Intelligent, Powerful Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production. Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time. Benefits - High throughput and superior detection with minimal number of false calls
- Especially designed for inspection of the finest lines down to 10μm
- Quick set-up even for the most complicated jobs for higher productivity
- Automation ready
- Very high uptime
SIP TechnologyTM Push-to-Scan®: - A ‘no set-up’ process
- Top AOI results with minimal effort or training
- The easiest, user-friendly interface (GUI)
- Full ‘Step and Repeat’ functions
Visual Intelligence: Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want. Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects. Visual Intelligence: - Full panel understanding, context-based detection engine
- Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed
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1
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$ 24,900.00 |
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259333
|
Insidix |
Compact II |
in Metrology Equipment
Insidix Compact II:currently in use available in Q1/2026
|
1
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N* |
|
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255041
|
KLA Tencor |
2367 |
in Microscope Inspection Tools
KLA 2367 "Escape" Bright Field Inspection Tool:BrightField Inspektionstool
25 cassette HW 200mm
GEM/SECS and HSMS Model
Enable .12 , .62, .39 Picels ORS Upgrade done Tool currently full installed at cleanroom (estimated time depending on areaneed)
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1
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255559
|
KLA Tencor |
Surfscan 6420 |
in Surface Inspection
KLA Surfscan 6420 #419:›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
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1
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255557
|
KLA Tencor |
Surfscan 6420 |
in Surface Inspection
KLA Surfscan 6420 #420:›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
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1
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255558
|
KLA Tencor |
Surfscan 6420 |
in Surface Inspection
KLA Surfscan 6420 (MET920-01):›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength
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1
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255505
|
Leica |
INS-3 |
in Metrology Equipment
Leica Review Station INS-3:Review Microskop for 6 and 8"
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1
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256664
|
Olympus |
|
in Optical Microscopes
Low power optical scope:Location is at Infineon Penang.
|
2
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205912
|
Matrix Corp |
Matrix X3 |
in Metrology Equipment
Matrix X3 X-Ray System:high speed X-Ray system
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1
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258121
|
Rudolph Technologies |
mWL 150/200 t |
in Metrology Equipment
|
1
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N* |
|
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252025
|
Semilab |
SDI-FAAST_230 |
in Metrology Equipment
SDI METRON / Semilab SDI-FAAST_230:Configuration: Mainframe Rack of Powersupply is defective – Powersupply is ok Function is ok – not in production but regular check Tool on cleanroom floor 1 Palette of spares included: 2x Motion Controller (Newport Modell MM3000) 1x DSP Lock-IN Amplifier 1x Roboter Controller (Pri ESC-212) 1x Hot Chuck Temperatur Box (SDI) 1x Controller Fe Activation Box (SDI) 1x Roboter (Pri ATM-105-1-S) 1x Voltmeter (PDM-40a) 1x Voltmeter (PDM-60V) 1x Function Generator (Wafetek model 29) 1x Aligner (Brooks PRE-200) 2x Power Supply (Bertan 2341-1) 1x Box mit Anleitungen, div. Kleinteilen, Kabel
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1
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258570
|
Tencor |
Auto RS75/tc |
in Film Thickness Testers
Tencor OmniMap Auto RS75/tc :layer thicknesses equipment
|
1
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|
|
N* |
|
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256550
|
Trinocular Stereo Zoom Microscope |
in Optical Microscopes
Trinocular Stereo Zoom Microscope:Penang Trinocular Stereo Zoom Microscope Brand : Radiant Instruments Asset Number: ZNPG-102904-0
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1
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