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Item ID  Short Description Product Type / Details # Price Notes Make Model     204578 Orbotech   Ultra Discovery VM  Miscellaneous Metrology Equipment in Metrology Equipment AOI Orbotech Ultra Discovery VM: Simple, Intelligent, Powerful Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production. Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time. Benefits High throughput and superior detection with minimal number of false calls Especially designed for inspection of the finest lines down to 10μm Quick set-up even for the most complicated jobs for higher productivity Automation ready Very high uptime SIP TechnologyTM Push-to-Scan®: A ‘no set-up’ process Top AOI results with minimal effort or training The easiest, user-friendly interface (GUI) Full ‘Step and Repeat’ functions Visual Intelligence: Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want. Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects. Visual Intelligence: Full panel understanding, context-based detection engine Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed     1 $ 24,900.00 210272 Bruker   Fabline D8  Xray Fluorescence Spectrometers in Spectrometers Bruker Fabline D8 : Röntgendiffraktometer zur Messung hochauflösender Röntgenbeugung und Röntgenreflektion mit CU-KA Anode für 6" und 8" Wafer   X-Ray Diffractometer for measuring high resolution X-ray Diffraction and Reflection applications with a Cu-kA Anode for 6 and 8 inch wafers Still in production. Ready for inspection. 1   166465 Oxford Instruments   CMI 950  Xray Fluorescence Spectrometers in Spectrometers CMI 950 - Xray fluorescence spectrometer: X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc. Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag). System is fully packed on pallette (241kg, 1mx0,9mx1,5m) 1   F* 214949 HMI E SCANLIGHT - EBEAM  Miscellaneous Metrology Equipment in Metrology Equipment HMI E SCANLIGHT - EBEAM: 200/300mm Bridge Tool, Last audit health status report available 1   205912 Matrix Corp   Matrix X3  Miscellaneous Metrology Equipment in Metrology Equipment Matrix X3 X-Ray System: high speed X-Ray system  1

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

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   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.