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Item ID  Short Description Product Type / Details # Price Notes Make Model     247975 Nova   SCAN-2040  Miscellaneous Metrology Equipment in Metrology Equipment 4 x NOVA SCAN-2040 Measurement System: NOVASCAN SCAN-2040 FILMTHICKNES INSPECTION 4 x Integriertes Ebara Measurement Systems and spare parts listed in file below 1   204578 Orbotech   Ultra Discovery VM  Miscellaneous Metrology Equipment in Metrology Equipment AOI Orbotech Ultra Discovery VM: Simple, Intelligent, Powerful Ultra Discovery VM delivers Simple, Intelligent and Powerful AOI performance with 10µm line/space inspection capabilities for FC-BGA, PBGA, CSP and COF production. Delivering super clear images essential for capturing the finest defects, the system achieves outstanding AOI results with minimal effort or training, even on complicated panels. Most of manufacturers’ valuable time on the system is spent inspecting panels. Logic false calls are virtually eliminated and overall false calls are minimized saving precious verification time. Benefits High throughput and superior detection with minimal number of false calls Especially designed for inspection of the finest lines down to 10μm Quick set-up even for the most complicated jobs for higher productivity Automation ready Very high uptime SIP TechnologyTM Push-to-Scan®: A ‘no set-up’ process Top AOI results with minimal effort or training The easiest, user-friendly interface (GUI) Full ‘Step and Repeat’ functions Visual Intelligence: Using SIP Technology, Ultra Discovery VM introduces Orbotech’s detection paradigm to the world of fine-line FC-BGA, PBGA/CSP and COF production. With the Visual Intelligence Detection Engine – now dedicated for IC substrate applications - manufacturers no longer have to choose between detection and false calls or waste time on non-critical defects. For the first time in AOI, detect all you want, and only what you want. Ultra Discovery VM is equipped with a super-fast optical head, which together with its dedicated IC substrate panel understanding, delivers exceptionally high throughput, superior detection and low false call rates. The optical head is specially designed for inspection of the finest lines down to 10µm. The customized professional lens, featuring unique wide angle illumination, delivers very clear images essential for capturing the finest defects. Visual Intelligence: Full panel understanding, context-based detection engine Equipped with ultra-fast sensors and powerful data processing for maximum inspection speed     1 $ 24,900.00 255041 KLA Tencor   2367  Automatic Wafer Inspection Tools in Microscope Inspection Tools KLA 2367 "Escape" Bright Field Inspection Tool: BrightField Inspektionstool 25 cassette HW 200mm GEM/SECS and HSMS Model Enable .12 , .62, .39 Picels ORS Upgrade done    Tool currently full installed at cleanroom (estimated time depending on areaneed) 1   N* 255557 KLA Tencor   Surfscan 6420  Unpatterned Wafer Inspection in Surface Inspection KLA Surfscan 6420: ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength 1   N* 255558 KLA Tencor   Surfscan 6420  Unpatterned Wafer Inspection in Surface Inspection KLA Surfscan 6420: ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength 1   N* 255559 KLA Tencor   Surfscan 6420  Unpatterned Wafer Inspection in Surface Inspection KLA Surfscan 6420: ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength 1   N* 255505 Leica   INS-3  Miscellaneous Metrology Equipment in Metrology Equipment Leica Review Station INS-3: Review Microskop for 6 and 8" 1   N* 205912 Matrix Corp   Matrix X3  Miscellaneous Metrology Equipment in Metrology Equipment Matrix X3 X-Ray System: high speed X-Ray system  1   252025 Semilab   SDI-FAAST_230  Miscellaneous Metrology Equipment in Metrology Equipment SDI METRON / Semilab SDI-FAAST_230: Configuration: Mainframe Rack of Powersupply is defective – Powersupply is ok Function is ok – not in production but regular check Tool on cleanroom floor 1 Palette of spares included: 2x Motion Controller (Newport Modell MM3000) 1x DSP Lock-IN Amplifier 1x Roboter Controller (Pri ESC-212) 1x Hot Chuck Temperatur Box (SDI) 1x Controller Fe Activation Box (SDI) 1x Roboter (Pri ATM-105-1-S) 1x Voltmeter (PDM-40a) 1x Voltmeter (PDM-60V) 1x Function Generator (Wafetek model 29) 1x Aligner (Brooks PRE-200) 2x Power Supply (Bertan 2341-1) 1x Box mit Anleitungen, div. Kleinteilen, Kabel 1

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

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   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.