Item ID: 204220

**2 Offered at Best Price**

Cyberscan CT350T Dual non-contact double-sided optical profilometer

2 Tools

- DUAL NON-CONTACT MEASUREMENT SYSTEM
- 3D MAPPING OF THICKNESS,BOW, WARPAGE AND ROUHGNESS
- USER FRIENDLY CONCEPT
- SOPHISTICATED ANALYSIS AND AUTOMATION SOFTWARE

Tools are still running in production. Available from May/June 2019

Inspection possible!

The tools are pretty new and rarely used. Vintage 2018 and 2015

The CT 350T was originally designed for measuring
thickness of substrates and wafers. It provides
accurate measurements independent of material
and surface properties. There is no limitation on the
minimum thickness, even measurements of samples
with a thickness of only a few microns can easily be
taken.

Please be invited to take a look at the pictures.

Cyberscan CT350T Dual non-contact double-sided optical profilometer

... other images

Unit Price	Unstated
Number of Units	2
Model	ct 350
Description	pretty new
Other Information	The CT 350T is a non-contact double-sided optical profilometer with a 300 mm x-/y- scanning stage. The upper sensor is mounted on a highly accurate z-axis with 100 mm range, while the lower sensor is stationary inside the granite platform. Both sensors collect height data synchronized with x-, y- encoder signals and are aligned axially in order to ensure accurate differential thickness measurements. The software generates 2D profiles and 3D maps simultaneously from the top and the bottom surface and calculates the corresponding total thickness profile or map. The motion system uses fast and accurate magnetic linear motors. By triggering the chromatic white light sensors at a data rate of 4 kHz the inspection time is minimized. The sensors are available with a z-resolution down to 3 nm and a measurement range up to 25 mm. With an adapter plate on the stage aperture the system can be used as a standard optical surface profilometer which makes the CT 350T the most versatile surface and thickness measurement system. The system is also available in a smaller version as CT 250T with 200 mm travel ideally for 8” wafers or substrates and solar wafers. Technology Fast and accurate dual scanning system Measurement speed: 4 kHz 300 mm (200 mm) travel in x- and y-direction, lateral resolution 50 nm, motorized z-axis resolution 5 nm 2D profiles and 3D topographical maps and 3D thickness maps Large scanning area Maximum x-, y-, z-resolution up to the full maximum travel of 300 mm (200 mm) Chromatic white light sensors Z-resolution down to 3 nm, measurement range up to 25 mm High resolution off-axis camera
Condition	Like New
Year of Manufacture	2018

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FULL DESCRIPTION of Item 204220

2 Offered at Best Price

Cyberscan CT350T Dual non-contact double-sided optical profilometer

**2 Offered at Best Price**