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Cyberscan CT350T Dual non-contact double-sided optical profilometer
2 Tools - DUAL NON-CONTACT MEASUREMENT SYSTEM - 3D MAPPING OF THICKNESS,BOW, WARPAGE AND ROUHGNESS - USER FRIENDLY CONCEPT - SOPHISTICATED ANALYSIS AND AUTOMATION SOFTWARE Tools are still running in production. Available from May/June 2019 Inspection possible! The tools are pretty new and rarely used. Vintage 2018 and 2015 The CT 350T was originally designed for measuring thickness of substrates and wafers. It provides accurate measurements independent of material and surface properties. There is no limitation on the minimum thickness, even measurements of samples with a thickness of only a few microns can easily be taken. Please be invited to take a look at the pictures.
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