Cyberscan CT350T Dual non-contact double-sided optical profilometer
- DUAL NON-CONTACT MEASUREMENT SYSTEM
- 3D MAPPING OF THICKNESS,BOW, WARPAGE AND ROUHGNESS
- USER FRIENDLY CONCEPT
- SOPHISTICATED ANALYSIS AND AUTOMATION SOFTWARE
Tools are still running in production. Available from May/June 2019
Inspection already possible!
The tools are pretty new and rarely used. Vintage 2018 and 2015
The CT 350T was originally designed for measuring
thickness of substrates and wafers. It provides
accurate measurements independent of material
and surface properties. There is no limitation on the
minimum thickness, even measurements of samples
with a thickness of only a few microns can easily be
Please be invited to take a look at the pictures.