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CMI 950 - Xray fluorescence spectrometer
X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc. Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).
System is fully packed on pallette (241kg, 1mx0,9mx1,5m)
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