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ALL CATEGORIES   Metrology Eq   Wafer Inspection

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	View All Offers Under Surface Inspection » Switch Major Category		Click an item's ID# below for its full specifications , or: Group Offers into sub-categories under Surface Inspection List all 2 product types under Surface Inspection

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Item ID  Short Description Product Type / Details # Price Notes Make Model     255557 KLA Tencor   Surfscan 6420  Unpatterned Wafer Inspection in Surface Inspection KLA Surfscan 6420: ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength 1   255558 KLA Tencor   Surfscan 6420  Unpatterned Wafer Inspection in Surface Inspection KLA Surfscan 6420: ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength 1   255559 KLA Tencor   Surfscan 6420  Unpatterned Wafer Inspection in Surface Inspection KLA Surfscan 6420: ›Automatic Surface Inspection System ›Bare Wafer Surface Defect Inspection System ›Substrate/Sizes: 6" and 8" Wafer Capable ›Thickness: SEMI Standard Wafer Thickness ›Throughput: 100 wph (200 mm) at 0.12 mm ›Illumination Source: 30 mW Argon-Ion laser, 488 nm Wavelength 1

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

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