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Test & Measurement Equipment


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List all 34 product types under Test & Measurement EquipmentList all 34 product types under Test & Measurement Equipment

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 Offered (box) or Wanted (coins)  Item ID  Short Description Product Type / Details # Price Notes
Make Model
   
209845
200mm THIN WAFER Loader NSX 

List all items of this typeTest & Measurement - Other

in Test & Measurement Equipment

200mm THIN WAFER Loader NSX:

200mm THIN WAFER Loader NSX

“NIDEC SANKYO Corporation” , Model: “SR8220-019”, SN. „FR00891253“

1  
221743

Mitutoyo  

QVT1-X606P1L-D 

List all items of this typeOptical Test & Measurement Equipment - Other

in Optical Test & Measurement Equipment

For Sale! Mitutoyo CNC Vision Measuring Machine :

In use until October 2020, when it was phased out from production. Since then, it's stored in a dry and heated environment. Besides minor marks and scratches caused by trolleys, it's in an excellent condition. It was maintained regularly by site maintenance, and went through yearly inspection by OEM, including calibration.

Standard machine, with special adapter plates used at Infineon. It's with software for series production, able to measure multiple modules in row. Saves date to local CSV file format and writing measurement data to Orbit system.,

Possibility to upgrade tactile measuring function!

1 € 55,000.00
242857

KLA  

eS32 

List all items of this typeTest & Measurement - Other

in Test & Measurement Equipment

KLA eS32 E-beam Wafer Inspection 200mm:

eS32 is a top-of-the-line mask and wafer inspection equipment that is designed to meet the most stringent quality standards for semiconductor product manufacturing. This system provides comprehensive, high-resolution inspection of both masks and wafers with unparalleled accuracy. The unit uses a proprietary optical probe to scan masks and wafers to detect defects and irregularities with a resolution reaching down to 1 micron. This high-precision scanning allows for comprehensive inspection of the entire surface of both the mask and wafer. The machine also includes powerful image processing and analysis algorithms which automatically detect defects, categorize them, and track their locations. KLA eS32 also includes a suite of automated defect correction tools which can rapidly repair standard and complex defects. In addition to its exhaustive defect detection capabilities, this tool also allows for statistical process control (SPC) analysis to ensure production processes maintain consistent quality and accuracy over time. TENCOR ES 32 also includes a user-friendly interface that makes it easy to operate and manage the asset. This user interface is highly customizable, allowing users to quickly change model settings, view detailed inspection reports, and receive real-time notifications of detected defects. In summary, KLA ES 32 is a high-performance mask and wafer inspection equipment that offers superior detection accuracy, automated defect correction, comprehensive statistical process control (SPC) analysis, and an easy-to-use user interface. This system can be used to monitor production lines, resulting in improved manufacturing quality, increased yield, and cost savings.

1  
241426

Rudolph Research  

Scale 

List all items of this typeTest & Measurement - Other

in Test & Measurement Equipment

1  
247183

Nova  

2040 dry 

List all items of this typeTest & Measurement - Other

in Test & Measurement Equipment

1 lot  


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
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   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.