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Metrology Equipment


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 4 & 6 Point Probes  in Resistivity Testers  (no items)

 Atomic Absorption  in Spectrophotometers  (no items)

 Automatic Wafer Inspection Tools  in Microscope Inspection Tools  (no items)

 Bulbs  in Parts and Accessories, Microscope  (no items)

 Camera Lenses  in Parts and Accessories, Microscope  (no items)

 Cameras and Controllers  in Optical Microscopes  (no items)

 CD Measurement - Other  in Critical Dimension Measurement Equipment  (no items)

 Condensers  in Parts and Accessories, Microscope  (no items)

 Critical Dimension Scanning Electron Microscopes  in Critical Dimension Measurement Equipment  (no items)

 Cut-Off Saws  in Slicing Saws  (no items)

 CV Plotters  in Metrology Equipment  (no items)

 Ellipsometers  in Film Thickness Testers  (no items)

 Eyepieces  in Parts and Accessories, Microscope  (no items)

 Fiber Optic Bundles  in Fiber Optic Illuminators  (no items)

 Fiber Optic Light Sources  in Fiber Optic Illuminators  (no items)

 Film Thickness Testers - Other  in Film Thickness Testers  (no items)

 Focused Ion Beam Tools  in Ion Beam Equipment  (no items)

 FT-IR Spectrometers  in Spectrometers  (no items)

 FT-IR Spectrophotometers  in Spectrophotometers  (no items)

 Illuminators - Other  in Illuminators, Microscope  (no items)

 Implant Monitors  in Metrology Equipment  (no items)

 Inverted Microscopes  in Optical Microscopes  (no items)

 Mass Spectrometers  in Spectrometers  (no items)

 Measuring Microscopes  in Optical Microscopes  (no items)

 Microscopes - Other  in Optical Microscopes  (no items)

 Microspectrophotometers  in Spectrophotometers  (no items)

 Miscellaneous Metrology Equipment  in Metrology Equipment  (4)

 Mounting Press  in Sample Preparation  (no items)

 Non-Contact Resistivity Testers  in Resistivity Testers  (no items)

 Nosepieces  in Parts and Accessories, Microscope  (no items)

 Nuclear Magnetic Resonance Spectrometers  in Spectrometers  (no items)

 Objective Lenses  in Parts and Accessories, Microscope  (no items)

 Optical CD Measurement  in Critical Dimension Measurement Equipment  (no items)

 Optical Heads  in Parts and Accessories, Microscope  (no items)

 Other Items  in Microscopes  (no items)

 Overlay Registration  in Critical Dimension Measurement Equipment  (no items)

 Parts and Accessories - Other  in Parts and Accessories, Microscope  (no items)

 Patterned Wafer Inspection  in Surface Inspection  (no items)

 Polishing & Grinding Sample Prep Equipment  in Sample Preparation  (no items)

 Polishing Equipment - Other  in Sample Preparation  (no items)

 Profilometers  in Film Thickness Testers  (no items)

 Reticles  in Parts and Accessories, Microscope  (no items)

 Sample Coaters  in Sample Preparation  (no items)

 Sample Preparation - Other  in Sample Preparation  (no items)

 Scanning Electron Microscopes  in Electron Microscopy  (no items)

 Spectrometers - Other  in Spectrometers  (no items)

 Spreading Resistance Probe  in Resistivity Testers  (no items)

 Stage Micrometers  in Parts and Accessories, Microscope  (no items)

 Stages  in Parts and Accessories, Microscope  (no items)

 Stands  in Parts and Accessories, Microscope  (no items)

 Stereo Microscopes  in Optical Microscopes  (no items)

 Stress Measurement Equipment  in Metrology Equipment  (no items)

 Transmission Electron Microscopes  in Electron Microscopy  (no items)

 Unpatterned Wafer Inspection  in Surface Inspection  (no items)

 Upright Microscopes  in Optical Microscopes  (no items)

 UV-Visible Spectrophotometers  in Spectrophotometers  (no items)

 Wafer Inspection Microscopes  in Optical Microscopes  (no items)

 Xray Fluorescence Spectrometers  in Spectrometers  (no items)