Item ID: 254741 1 Offered at Best Price AFM-2 (METV44-1) Atomic Force Microscope (AFM)An Atomic Force Microscope (AFM) measures topography, feature size, defects, and properties of solid surfaces. The Dimension X AFM provides depth metrology solutions. Unit Price Unstated Number of Units 1 Manufacturer Veeco Model AFM-2 (METV44-1) Description Atomic Force Microscope (AFM) Wafer Size Range Minimum 200 mm Maximum 300 mm Set Size 300 mm Power Requirements 6.0 A Year of Manufacture 2004 Condition Very Good Serial Number(s)107 Shipping & Handling:All items are sold on condition `as is and where is`. Ex work from current location excluding de-installation, de-hook up, discharge, packaging, crating and delivery. We are not responsible for any damage incurred during shipment. Payment:100% downpayment Make OFFERSend QUESTIONS
Atomic Force Microscope (AFM)An Atomic Force Microscope (AFM) measures topography, feature size, defects, and properties of solid surfaces. The Dimension X AFM provides depth metrology solutions.
All items are sold on condition `as is and where is`. Ex work from current location excluding de-installation, de-hook up, discharge, packaging, crating and delivery. We are not responsible for any damage incurred during shipment.
ALL CATEGORIES Silicon Preparation Wafer Mfg Metrology
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